Memory LSI
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Memory LSI digest of papers by Semiconductor Test Symposium (8th 1977 Cherry Hill, N.J.)

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Published by Institute of Electrical and Electronics Egineers in New York .
Written in English

Subjects:

  • Computer storage devices -- Testing -- Congresses.,
  • Integrated circuits -- Large scale integration -- Congresses.

Book details:

Edition Notes

Statementsponsored by the IEEE Computer Society and Philadelphia Section of the IEEE.
ContributionsIEEE Computer Society., Institute of Electrical and Electronics Engineers. Philadelphia Section.
The Physical Object
Paginationx, 198 p. :
Number of Pages198
ID Numbers
Open LibraryOL14151343M

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